About this Engineering article
Resistive RAM variability monitoring using a ring oscillator based test chip by Aziza, H.; Portal, J.-M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Aziza, H.; Portal, J.-M.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)