About this scholarly article

2013 25th International Conference on Microelectronics (ICM) - Temperature performances of bulk MOS transistors for use as temperature sensitive element for bolometer applications by Fuxa, Etienne; Yon, Jean-Jacques; Jomaah, Jalal is a scholarly article available to read on EtoBox.

Author

Fuxa, Etienne; Yon, Jean-Jacques; Jomaah, Jalal

Publisher

IEEE

Published

2013