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What is Low-Cost Spectroscopic Thickness Measurement about?
This paper presents the development of a low-cost spectroscopic reflectance system for measuring thin film thickness using two advanced sensors. The system demonstrates improved accuracy in thickness measurements compared to traditional methods, achieving a root mean squared error (RMSE) as low as 0.022. The research highlights the potential for scalability and application in industrial roll-to-roll processes for flexible electronics.
- Author
- keerthick vaasan
- Language
- EN