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About this Engineering article

Low-energy bismuth primary ion beams for molecular ion detection in TOF-SIMS by Miyayama, Takuya; Iida, Shin-ichi is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Miyayama, Takuya; Iida, Shin-ichi
Publisher
AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics; AVS Science and Technology Society (ISSN 1520-8567)
Published
2018
Field
Engineering (Physical Sciences)

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