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Can I read Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction on EtoBox?
Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction by Emil Zolotoyabko is a Engineering article available to read on EtoBox.
What is Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction about?
Energy-variable X-ray diffraction technique is further established as a novel method for depth-resolved measurements of residual strains in polycrystalline multilayers. Depth sensitivity is achieved by the controlled varying of the X-ray energy and, hence, X-ray penetration into the sample. In this paper, we develop analytical expression for the energy-dependent shape of the diffraction profile taken from a polycrystalline multilayer. We show that the maximum diffraction intensity recorded in the detector originates at a characteristic depth, Z c , which strongly depends on the X-ray penetration length, as in the case of homogeneous material considered in detail in our earlier publications [E. Zolotoyabko et al. J. Synchrotron Radiation 11 (2004) 309; Nucl. Instr. & Meth. Phys. Res. B 246, (2006) 244]. The multilayer periodicity only weakly influences the previously derived expressions for Z c . The accomplished analysis provides theoretical basis of using the energy-variable diffraction in polycrystalline multilayers. We apply this technique for characterizing the alumina/Ni samples produced by high-temperature diffusion bonding.
Who reads Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Emil Zolotoyabko
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)