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Resonant X-ray diffraction using high-resolution image-plate data by H. Ehrenberg; M. Knapp; T. Hartmann; H. Fuess; T. Wroblewski is a Materials Science article available to read on EtoBox.

What is Resonant X-ray diffraction using high-resolution image-plate data about?

The experimental setup for the collection of synchrotron X-ray powder diffraction data from samples with high absorption (μ__R__> 10) is described. It consists of a combination of a vacuum chamber with an image-plate system. A numerical absorption correction for the applied geometry has been derived and the data were corrected accordingly. Values for__f__ ′(Er) and__f__ ′′(Er) were refined from eight measurements on Er~5~Re~2~O~12~above and below the Er__L__~III~absorption edge. Successful refinement of the crystallographic data has verified the high quality of the collected intensities.

Who reads Resonant X-ray diffraction using high-resolution image-plate data?

Author

H. Ehrenberg; M. Knapp; T. Hartmann; H. Fuess; T. Wroblewski

Publisher

International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)

Published

2000

Language

EN

Field

Materials Science (Physical Sciences)