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Can I read Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, ... (Lecture Notes in Computer Science) on EtoBox?

Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, ... (Lecture Notes in Computer Science) by Bhavna Antony (editor), Huazhu Fu (editor), Cecilia S. Lee (editor), Tom MacGillivray (editor), Yanwu Xu (editor), Yalin Zheng (editor) is a nonfiction available to read on EtoBox.

What is Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, ... (Lecture Notes in Computer Science) about?

This book constitutes the refereed proceedings of the 9th International Workshop on Ophthalmic Medical Image Analysis, OMIA 2022, held in conjunction with the 25th International Conference on Medical Imaging and Computer-Assisted Intervention, MICCAI 2022, in Singapore, Singapore, in September 2022. The 20 papers presented at OMIA 2022 were carefully reviewed and selected from 33 submissions. The papers cover various topics in the field of ophthalmic medical image analysis and challenges in terms of reliability and validation, number and type of conditions considered, multi-modal analysis (e.g., fundus, optical coherence tomography, scanning laser ophthalmoscopy), novel imaging technologies, and the effective transfer of advanced computer vision and machine learning technologies.

Who reads Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, ... (Lecture Notes in Computer Science)?

It is typically read by self-directed learners exploring a subject in depth.

Common subject areas: history, science, philosophy, social sciences.

Author
Bhavna Antony (editor), Huazhu Fu (editor), Cecilia S. Lee (editor), Tom MacGillivray (editor), Yanwu Xu (editor), Yalin Zheng (editor)
Publisher
Springer International Publishing Springer
Published
2022
Language
EN
ISBN
9783031165245
Category
nonfiction
Subjects
Computer Science, Engineering, Stem

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