About this scholarly article

SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Anomaly Detection and Imaging with X-Rays (ADIX) II - Classification-free threat detection based on material-science-informed clustering by Ashok, Amit; Franco, Edward D.; Gehm, Michael E.; Neifeld, Mark A.; Wolter, Scott D.; Greenberg, Joel A. is a scholarly article available to read on EtoBox.

Author

Ashok, Amit; Franco, Edward D.; Gehm, Michael E.; Neifeld, Mark A.; Wolter, Scott D.; Greenberg, Joel A.

Publisher

SPIE

Published

2017

Language

EN