Opening book details…
Can I read Influence of Quasi-layer-by-layer Roughness on Proximity Effects in Thin Film Superconducting/normal-metal Junctions on EtoBox?
Influence of Quasi-layer-by-layer Roughness on Proximity Effects in Thin Film Superconducting/normal-metal Junctions by G. Palasantzas; J.Th.M. De Hosson is a Physics and Astronomy article available to read on EtoBox.
What is Influence of Quasi-layer-by-layer Roughness on Proximity Effects in Thin Film Superconducting/normal-metal Junctions about?
We investigate the in ̄uence of quasi-layer-by-layer interface roughness on proximity eects, at the junction of a thin surperconducting/normal-metal ®lm. The reduction of the superconducting ®lm critical temperature DT c =T c is shown to decrease with ®lm thickness in an oscillatory manner, which re ̄ects the presence of growth front pinning eects during roughness formation. The oscillations are signi®cant for weak surface relaxation where DT c =T c varies signi®cantly with ®lm thickness, and decrease in magnitude with increasing ®lm thickness. In contrast, in the presence of growth front instability, the pinning induced oscillations are shown to be further ampli®ed with increasing instability strength.
Who reads Influence of Quasi-layer-by-layer Roughness on Proximity Effects in Thin Film Superconducting/normal-metal Junctions?
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- G. Palasantzas; J.Th.M. De Hosson
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0921-4534)
- Published
- 2001
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)