About this Engineering article
Unified Mechanism for Positive- and Negative-Bias Temperature Instability in GaN MOSFETs by Guo, Alex; del Alamo, Jesus A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Guo, Alex; del Alamo, Jesus A.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)