About this scholarly article

2018 IEEE 4th Information Technology and Mechatronics Engineering Conference (ITOEC) - Investigations on effects of the acquisition rate on the test accuracy of the data acquisition unit by Ding, Ding; Zhang, Yi; Zhao, Yibo; Zhang, Shanshan; Du, Tianyun is a scholarly article available to read on EtoBox.

Author

Ding, Ding; Zhang, Yi; Zhao, Yibo; Zhang, Shanshan; Du, Tianyun

Publisher

IEEE

Published

2018

Language

EN