Opening book details…
About this Physics and Astronomy article
Electrical characteristics and reliability properties of metal-oxide-semiconductor field-effect transistors with ZrO[sub 2] gate dielectric by Hsu, De-Cheng; Wang, Ming-Tsong; Lee, Joseph Ya-min; Juan, Pi-Chun is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Hsu, De-Cheng; Wang, Ming-Tsong; Lee, Joseph Ya-min; Juan, Pi-Chun
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2007
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
More by Hsu, De-Cheng; Wang, Ming-Tsong; Lee, Joseph Ya-min; Juan, Pi-Chun
Browse all works by Hsu, De-Cheng; Wang, Ming-Tsong; Lee, Joseph Ya-min; Juan, Pi-Chun