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About this scholarly article
International Technical Digest on Electron Devices - Hot-holes generation and transport in n-MOSFETs: a Monte Carlo investigation by Venturi, F.; Fiegna, C.; Abramo, A.; Sangiorgi, E.; Ricco, B. is a scholarly article available to read on EtoBox.
- Author
- Venturi, F.; Fiegna, C.; Abramo, A.; Sangiorgi, E.; Ricco, B.
- Publisher
- IEEE
- Published
- 1990
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