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About this Engineering article
AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool by Semenov, Vasili K.; Polyakov, Yuri A.; Tolpygo, Sergey K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Semenov, Vasili K.; Polyakov, Yuri A.; Tolpygo, Sergey K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 2017
- Field
- Engineering (Physical Sciences)
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