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About this Engineering article
Detection of excess crystalline As and Sb in III-V oxide interfaces by Raman scattering by Farrow, Roger L.; Chang, Richard K.; Mroczkowski, Stanley; Pollak, Fred H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Farrow, Roger L.; Chang, Richard K.; Mroczkowski, Stanley; Pollak, Fred H.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1977
- Field
- Engineering (Physical Sciences)
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