About this scholarly article

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Angled flip-flop single-event cross sections for submicron bulk CMOS technologies by Gaspard, N.; Jagannathan, S.; Diggins, Z.; Reece, T.; Wen, S-J.; Wong, R.; Lilja, K.; Bounasser, M.; Loveless, T. D.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W. is a scholarly article available to read on EtoBox.

Author

Gaspard, N.; Jagannathan, S.; Diggins, Z.; Reece, T.; Wen, S-J.; Wong, R.; Lilja, K.; Bounasser, M.; Loveless, T. D.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W.

Publisher

IEEE

Published

2013

Language

EN