About this scholarly article

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Survivable self-checking sequential circuits by Levin, I.; Matrosova, A.; Ostanin, S. is a scholarly article available to read on EtoBox.

Author

Levin, I.; Matrosova, A.; Ostanin, S.

Publisher

IEEE Comput. Soc

Published

2001