About this scholarly article

Proceedings of the IEEE 1995 Custom Integrated Circuits Conference - High-level hot carrier reliability-driven synthesis using macro-models by Karnik, T.; Chin-Chi Teng, ; Sung-Mo Kang, is a scholarly article available to read on EtoBox.

Author

Karnik, T.; Chin-Chi Teng, ; Sung-Mo Kang,

Publisher

IEEE

Published

1995

Language

EN