About this scholarly article

SPIE Proceedings [SPIE Congress on Optics and Optoelectronics - Warsaw, Poland (Sunday 28 August 2005)] Optical Security Systems - Machine vision system for the industrial quality control of printed circuit boards by Esteve-Taboada, José J.; Jaroszewicz, Zbigniew; Popov, Sergei Y.; Pastor, Begoña; Goñi, Ignacio; Wyrowski, Frank; García, Ramón; Hervas, Juan; Molina-Jiménez, Teresa; Simón, Santiago; Pérez, Emilio is a scholarly article available to read on EtoBox.

Author

Esteve-Taboada, José J.; Jaroszewicz, Zbigniew; Popov, Sergei Y.; Pastor, Begoña; Goñi, Ignacio; Wyrowski, Frank; García, Ramón; Hervas, Juan; Molina-Jiménez, Teresa; Simón, Santiago; Pérez, Emilio

Publisher

SPIE

Published

2005