About this scholarly article

2005 8th European Conference on Radiation and Its Effects on Components and Systems - Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique by Ferlet-Cavrois, V.; Paillet, P.; McMorrow, D.; Melinger, J. S.; Campbell, A. B.; Gaillardin, M.; Faynot, O.; Thomas, O. is a scholarly article available to read on EtoBox.

Author

Ferlet-Cavrois, V.; Paillet, P.; McMorrow, D.; Melinger, J. S.; Campbell, A. B.; Gaillardin, M.; Faynot, O.; Thomas, O.

Publisher

IEEE

Published

2005

Language

EN