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About this Engineering article
A New Measurement Approach for Interface Thermal Resistance Using Frequency-scan Photothermal Reflectance Technique by Hua, Zilong; Ban, Heng is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hua, Zilong; Ban, Heng
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1290-0729)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)