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About this Engineering article
High-temperature stability of refractory-metal VLSI GaAs MESFETs by Shenoy, K.V. ;Fonstad, C.G. ;Mikkelson, J.M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Shenoy, K.V. ;Fonstad, C.G. ;Mikkelson, J.M.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)
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