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About this Materials Science article
The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM) by A. Fattah-alhosseini; F. Soltani; F. Shirsalimi; B. Ezadi; N. Attarzadeh is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- A. Fattah-alhosseini; F. Soltani; F. Shirsalimi; B. Ezadi; N. Attarzadeh
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0010-938X)
- Published
- 2011
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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