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About this Engineering article
In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories by Shi, Yuanyuan; Ji, Yanfeng; Hui, Fei; Nafria, Montserrat; Porti, Marc; Bersuker, Gennadi; Lanza, Mario is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Shi, Yuanyuan; Ji, Yanfeng; Hui, Fei; Nafria, Montserrat; Porti, Marc; Bersuker, Gennadi; Lanza, Mario
- Publisher
- Wiley (John Wiley & Sons); Wiley-VCH Verlag; Wiley (ISSN 2199-160X)
- Published
- 2015
- Field
- Engineering (Physical Sciences)