Skip to content

Opening book details…

About this Engineering article

Radiation Effects on Junction Field Effect Transistors by Shedd, W.; Buchanan, B.; Dolan, R. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Shedd, W.; Buchanan, B.; Dolan, R.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
Published
1969
Field
Engineering (Physical Sciences)

More by Shedd, W.; Buchanan, B.; Dolan, R.

Browse all works by Shedd, W.; Buchanan, B.; Dolan, R.