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This document discusses the optical properties and electrical characteristics of cerium dioxide (CeO2) thin films, highlighting their potential as high-dielectric-constant materials for MOSFET applications. The study employs spectroscopic ellipsometry to determine the optical dielectric function and identifies current conduction mechanisms, including Poole-Frenkel and Schottky emissions. Key findings include a bandgap energy of approximately 3.32 eV, a refractive index of 2.18, and a significant reduction i
- Author
- Italo Emanoel da Costa Pereira
- Language
- EN