About this scholarly article

SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2006 - San Jose, CA (Saturday 21 January 2006)] Photonic Crystal Materials and Devices IV - Refractive index and geometrical structure measurement of a core-doped photonic crystal fiber by Youk, Y.; Kim, S.; Oh, K.; Kobelke, J.; Schuster, K.; Kirchhof, J.; Kim, D. Y.; Adibi, Ali; Lin, Shawn-Yu; Scherer, Axel is a scholarly article available to read on EtoBox.

Author

Youk, Y.; Kim, S.; Oh, K.; Kobelke, J.; Schuster, K.; Kirchhof, J.; Kim, D. Y.; Adibi, Ali; Lin, Shawn-Yu; Scherer, Axel

Publisher

SPIE

Published

2006