About this scholarly article

2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497) - Effect of photo-assisted RIE damage in GaN Schottky structures by Mouffak, Z.; Medelci-Djezzar, N.; Trombetta, L. is a scholarly article available to read on EtoBox.

Author

Mouffak, Z.; Medelci-Djezzar, N.; Trombetta, L.

Publisher

IEEE

Published

2001