About this scholarly article

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on the detection sensitivity of APS star… by Li, Jie; Liu, Jinguo; Li, Guangze; Pan, Junhua; Wyant, James C.; Wang, Hexin is a scholarly article available to read on EtoBox.

Author

Li, Jie; Liu, Jinguo; Li, Guangze; Pan, Junhua; Wyant, James C.; Wang, Hexin

Publisher

SPIE

Published

2007