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A Method for Quantifying in Plane Permeability of Porous Thin Films by Rong, Guoguang; Palko, James W.; Oyarzun, Diego I.; Zhang, Chi; Hämmerle, Jacob; Asheghi, Mehdi; Goodson, Kenneth E.; Santiago, Juan G. is a Chemistry article available to read on EtoBox.

What is A Method for Quantifying in Plane Permeability of Porous Thin Films about?

The in-plane permeability of porous thin films is an important fluid mechanical property that determines wicking and pressure-driven flow behavior in such materials. This property has so far been challenging to measure directly due to the small sidewall cross-sectional area of thin films available for flow. In this work, we propose and experimentally demonstrate a novel technique for directly measuring in-plane permeability of porous thin films of arbitrary thicknesses, in situ, using a manifold pressed to the top surface of the film. We both measure and simulate the influence of the two dimensional flow field produced in a film by the manifold and extract the permeability from measurements of pressure drop at fixed flow rates. Permeability values measured using the technique for a periodic array of channels are comparable to theoretical predictions. We also determine in-plane permeability of arrays of pillars and electrodeposited porous copper films. This technique is a robust tool to characterize permeability of thin films of arbitrary thicknesses on a variety of substrates. In Supplementary material, we provide a solid model, which is useful in three-dimensional printer reproduc

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Author

Rong, Guoguang; Palko, James W.; Oyarzun, Diego I.; Zhang, Chi; Hämmerle, Jacob; Asheghi, Mehdi; Goodson, Kenneth E.; Santiago, Juan G.

Publisher

Elsevier Science; Elsevier ; Elsevier Inc.; Elsevier BV (ISSN 0021-9797)

Published

2018

Language

EN

Field

Chemistry (Physical Sciences)