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About this Engineering article
Ellipsometric Monitoring of an Oriented Diamond Nucleation Process in Bias-enhanced Chemical Vapor Deposition by Hayashi, Yasuaki; Li, Xi; Nishino, Shigehiro is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hayashi, Yasuaki; Li, Xi; Nishino, Shigehiro
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)
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