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Proceedings of the IEEE 1995 National Aerospace and Electronics Conference. NAECON 1995 - Reliability of flight critical system components and their "history of abuse" by Skormin, V.A.; Popyack, L.J. is a scholarly article available to read on EtoBox.

Author
Skormin, V.A.; Popyack, L.J.
Publisher
IEEE
Published
1995
Language
EN