Opening book details…
About this Engineering article
Measurement of Minority Carrier Lifetime Profiles in Silicon by G. Schwab; H. Bernt; H. Reichl is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- G. Schwab; H. Bernt; H. Reichl
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 1977
- Language
- EN
- Field
- Engineering (Physical Sciences)