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Comparison of stability of WSi[sub X]/SiC and Ni/SiC Schottky rectifiers to high dose gamma-ray irradiation by Kim, Jihyun; Ren, F.; Chung, G. Y.; MacMillan, M. F.; Baca, A. G.; Briggs, R. D.; Schoenfeld, D.; Pearton, S. J. is a Engineering article available to read on EtoBox.
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- Author
- Kim, Jihyun; Ren, F.; Chung, G. Y.; MacMillan, M. F.; Baca, A. G.; Briggs, R. D.; Schoenfeld, D.; Pearton, S. J.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)