About this scholarly article

2013 IEEE International Reliability Physics Symposium (IRPS) - Resistor-less power-rail ESD clamp circuit with ultra-low leakage current in 65nm CMOS process by Chih-Ting Yeh, ; Ming-Dou Ker, is a scholarly article available to read on EtoBox.

Author

Chih-Ting Yeh, ; Ming-Dou Ker,

Publisher

IEEE

Published

2013