About this scholarly article

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures - Dependence of SPICE Level 3 model parameters with transistor size by Perello, C.; Lozano, M.; Cane, C.; LoraTamayo, E. is a scholarly article available to read on EtoBox.

Author

Perello, C.; Lozano, M.; Cane, C.; LoraTamayo, E.

Publisher

IEEE

Published

1992

Language

EN