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About this Engineering article
Characterization and modelling of carrier distribution and gate capacitance in MOS structure inversion layer by Yutao, ; Liu, Litian; Yu, Zhiping; Li, Zhijian is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yutao, ; Liu, Litian; Yu, Zhiping; Li, Zhijian
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0020-7217)
- Published
- 2001
- Field
- Engineering (Physical Sciences)
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