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About this Engineering article
Effects of nitrogen incorporation on the interfacial layer between thermally grown dielectric films and SiC by Corre^a, S. A.; Radtke, C.; Soares, G. V.; Miotti, L.; Baumvol, I. J. R.; Dimitrijev, S.; Han, J.; Hold, L.; Kong, F.; Stedile, F. C. is a Engineering article available to read on EtoBox.
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- Author
- Corre^a, S. A.; Radtke, C.; Soares, G. V.; Miotti, L.; Baumvol, I. J. R.; Dimitrijev, S.; Han, J.; Hold, L.; Kong, F.; Stedile, F. C.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2009
- Field
- Engineering (Physical Sciences)