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Effects of nitrogen incorporation on the interfacial layer between thermally grown dielectric films and SiC by Corre^a, S. A.; Radtke, C.; Soares, G. V.; Miotti, L.; Baumvol, I. J. R.; Dimitrijev, S.; Han, J.; Hold, L.; Kong, F.; Stedile, F. C. is a Engineering article available to read on EtoBox.

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Author
Corre^a, S. A.; Radtke, C.; Soares, G. V.; Miotti, L.; Baumvol, I. J. R.; Dimitrijev, S.; Han, J.; Hold, L.; Kong, F.; Stedile, F. C.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
2009
Field
Engineering (Physical Sciences)

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Browse all works by Corre^a, S. A.; Radtke, C.; Soares, G. V.; Miotti, L.; Baumvol, I. J. R.; Dimitrijev, S.; Han, J.; Hold, L.; Kong, F.; Stedile, F. C.