About this scholarly article

2019 IEEE MTT-S International Microwave Symposium (IMS) - Ultra-Fast (13ns) Low Frequency/Microwave Transient Measurements, Application to GaN Transistors Characterization of Pulse to Pulse Stability by Ben-Sassi, M.; Neveux, G.; Barataud, D. is a scholarly article available to read on EtoBox.

Author

Ben-Sassi, M.; Neveux, G.; Barataud, D.

Publisher

IEEE

Published

2019

Language

EN