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About this Engineering article
Current sensing device for micro‐IDDQ test by Koichi Nose; Takayasu Sakurai is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Koichi Nose; Takayasu Sakurai
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Scripta Technica; Wiley (ISSN 8756-663X)
- Published
- 2001
- Field
- Engineering (Physical Sciences)