About this scholarly article

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - HC reliability of 0.5 /spl mu/m BiCMOS transistors: dependence on link base slot depth and the design implications for reliability and performance by Varker, C.J.; Kirchgessner, J.; Zirkle, T.; Howard, E. is a scholarly article available to read on EtoBox.

Author

Varker, C.J.; Kirchgessner, J.; Zirkle, T.; Howard, E.

Publisher

IEEE

Published

1994

Language

EN