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About this Computer Science article
Probe Test Yield Optimization Based on Canonical Correlation Analysis Between Process Control Monitoring Variables and Probe Bin Variables by So Young Sohn; Su Gak Lee is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- So Young Sohn; Su Gak Lee
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0957-4174)
- Published
- 2012
- Field
- Computer Science (Physical Sciences)