About this scholarly article

2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Precision metrology with weak measurements using spin splitting of light by Qiu, Xiaodong; Xie, Linguo; Du, Jinglei; Zhang, Zhiyou; Du, Jinglei; Zhang, Zhiyou is a scholarly article available to read on EtoBox.

Author

Qiu, Xiaodong; Xie, Linguo; Du, Jinglei; Zhang, Zhiyou; Du, Jinglei; Zhang, Zhiyou

Publisher

IEEE

Published

2016

Language

EN