About this scholarly article

10th IEEE International Conference on Nanotechnology - Micromachined planar probe using half-SIW and half-shielded stripline structure for permittivity measurement by Bang, Yong-Seung; Kim, Namgon; Kim, Jung-Mu; Cheon, Changyul; Kwon, Youngwoo; Kim, Yong-Kweon is a scholarly article available to read on EtoBox.

Author

Bang, Yong-Seung; Kim, Namgon; Kim, Jung-Mu; Cheon, Changyul; Kwon, Youngwoo; Kim, Yong-Kweon

Publisher

IEEE

Published

2010

Language

EN