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About this Engineering article
System Performance Measurement and Analysis of Optical Steganography Based on Noise by Wu, Ben; Shastri, Bhavin J.; Prucnal, Paul R. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wu, Ben; Shastri, Bhavin J.; Prucnal, Paul R.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1041-1135)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)
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