About this scholarly article

Proceedings of the 2009 ACM symposium on Applied Computing - SAC '09 - Enhanced lattice-based adaptive random testing by Chen, T. Y.; Huang, De Hao; Kuo, F.-C.; Merkel, R. G.; Mayer, Johannes is a scholarly article available to read on EtoBox.

Author

Chen, T. Y.; Huang, De Hao; Kuo, F.-C.; Merkel, R. G.; Mayer, Johannes

Publisher

ACM Press

Published

2009

Language

EN