About this scholarly article

Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Testability analysis of IDDQ testing with large threshold value by Hashizume, M.; Yotsuyanagi, H.; Tamesada, T.; Takeda, M. is a scholarly article available to read on EtoBox.

Author

Hashizume, M.; Yotsuyanagi, H.; Tamesada, T.; Takeda, M.

Publisher

IEEE Comput. Soc

Published

2000