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About this Engineering article
Hot-carrier effects on radio frequency noise characteristics of LDD n-type metal–oxide–semiconductor field effect transistors by Kwan, W. S.; Chen, C. H.; Deen, M. J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kwan, W. S.; Chen, C. H.; Deen, M. J.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
- Published
- 2000
- Field
- Engineering (Physical Sciences)