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About this Engineering article
An ab initio Study of Native Defects in Cubic SiC: Vacancies and Stacking Faults by Zywietz, A.; Käckell, P.; Furthmüller, J.; Bechstedt, Friedhelm is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zywietz, A.; Käckell, P.; Furthmüller, J.; Bechstedt, Friedhelm
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 1998
- Field
- Engineering (Physical Sciences)
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