About this scholarly article

Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10 - Preliminary analysis of the effects of confirmation bias on software defect density by Calikli, Gul; Bener, Ayse is a scholarly article available to read on EtoBox.

Author

Calikli, Gul; Bener, Ayse

Publisher

ACM Press

Published

2010